Electric field compensation and sensing with a single ion in a planar trap

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Date: 
2011-06-10
Author(s): 

S. Narayanan, N. Daniilidis, S. Möller, R. Clark, F. Ziesel, K. Singer, F. Schmidt-Kaler, H. Häffner

Reference: 

arXiv:1106.2730 (2011)

We use a single ion as an movable electric field sensor with accuracies on the order of a few V/m. For this, we compensate undesired static electric fields in a planar RF trap and characterize the static fields over an extended region along the trap axis. We observe a strong buildup of stray charges around the loading region on the trap resulting in an electric field of up to 1.3 kV/m at the ion position. We also find that the profile of the stray field remains constant over a time span of a few months.